PS 226

PS 226 Materials Characterization (3 units)

This is a survey of destructive and non-destructive materials characterization techniques. The techniques are classified as to whether they test the physical, chemical or electronic properties of materials. Special attention will be devoted to techniques for semiconductors.

Prerequisite: PS 222, PS 223

Bibliography
 
Altergott, W. & Henneke, E., eds., Characterisation of Advanced Materials, Kluwer Academic/Plenum Publishers, 1991.
Brandon, D. & Kaplan, Wayne D., Microstructural Characterization of Materials, John Wiley & Son Ltd, 1999.
Flewitt, P. E. J. & Wild, R. K., Physical Methods for Materials Characterisation, Springer, 1994.
Perry, D. L., ed., Applications of Analytical Techniques to the Characterization of Materials, Kluwer Academic/Plenum Publishers, 1992.
Schroder, Dieter K., Semiconductor Material and Device Characterization, New York: John Wiley & Sons, Inc., 1990.
Sibilia, John P., A Guide to Materials Characterization and Chemical Analysis 2nd Ed., Vch Pub, 1996.
Stradling, R. A. & Klipstein, P. C., eds., Growth and Characterisation of Semiconductors, Springer, 1990.
Wilson, S., Brundle, C. R. & Evans, C., eds., Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films, Butterworth-Heinemann, 1992.